Analysis and Testing Laboratory
Inspection. Validation. Proven Performance.
FROM ONE-TIME TESTING TO COMPREHENSIVE DIAGNOSTICS — CUSTOMIZED ANALYSIS AND TESTING SOLUTIONS ARE NOW IN-HOUSE.
Creation now offers a complete suite of analysis, testing and failure diagnostic services all in-house, facilitating our ability to validate subassembly performance for your life-saving and other mission-critical products. Whether it’s single-instance testing or developing integrated, turnkey diagnostic programs to keep your supply chain flowing, Creation provides the capability and flexibility you need — solving challenges, minimizing risk and customizing testing solutions developed to meet your most stringent specifications.
Learn more about our analysis and testing laboratory
SOLVING CHALLENGES
Driven by our extensive end-use application knowledge and supported by our unparalleled onsite engineering and supply chain expertise, Creation collaborates with your team in creating methodical, detailed approaches for solving your most vexing testing challenge. From the simplest of one-time analyses to the most complex diagnostic programs, Creation delivers…
- Deep Electronics Manufacturing Experience
- Multidisciplinary Approaches
- Forensic-Style Investigation
MINIMIZING RISK
As the only EMS with an onsite testing laboratory approved by the Defense Logistics Agency (DLA) for their Qualified Testing Supplier List (QTSL) program, Creation is equipped with state-of-the-art diagnostic equipment to test everything from subassembly performance to identifying single counterfeit components. With an expert team with over 25 years of testing experience behind it, count on Creation to champion…
- High-Quality Testing Standards
- Tailored Testing Plans
- Expert Risk Mitigation Methodologies
DELIVERING SOLUTIONS
Our impressive 72,000-square-foot onsite lab is operated by a dedicated staff that is committed to making your priorities their own. With flexible diagnostic services for testing and validating electronic components, integrated circuits and printed circuit boards, Creation ensures…
- Rapid Turnaround for Testing and Reporting
- Flexible Analysis Program Development
- Seamless Integration with Manufacturing
"Proactive Solutions for Your Customers"
Aftermarket Division of Industrial Controls OEM
CAPABILITIES TO VALIDATE MANUFACTURING EXCELLENCE
Root-Cause Failure Analysis
Identify the source of quality and reliability issues with solutions for…
- Product Design Failure
- Low Yields
- Poor Performance
- Degradation
Reliability and Qualification Services
Ensure the fitness of a device for use in the field, with capabilities that include…
- Up-screening
- Destructive Physical Analysis (DPA)
- Environmental and Accelerated Life Testing
- Burn-In
- Construction Analysis
Inspection and Authenticity Testing
Validate quality and integrity of components against approved devices to minimize supply chain disruption, testing for…
- Counterfeit Component Detection
- Lot Acceptance
- Construction Analysis
- Obsolescence Management
Non-Destructive Testing
TESTING PROCEDURE
- Up-screening
- Optical Inspection
- X-Ray Inspection
- Scanning Acoustic Microscopy
- X-Ray Fluorescence
- Seal Testing
- Scanning Electron
- Microscope/EDS
- Particle Impact Noise Detection
- FTIR Spectroscopy
- Solderability Testing
- Thermal Cycling
- Electrical Testing
- HAST
- Reflow Profiling
APPLICABLE METHODS
- MIL-STD-202
- MIL-STD-883, 750, AS6081
- MIL-STD-883, 750, 202
- IPC/JEDEC J-STD-005
- AS6081, JEDS213, IPC-4552
- MIL-STD-883, 750, 202
- MIL-STD-883, 750
- MIL-STD-883, 750
- ASTM E 334, ASTM E 1131
- J-STD
- MIL-STD-883, 750
- AS6081, MIL-STD-883
- AS6171 /2/3/4/5/6/9 Accredited
LABORATORY ACCREDITATIONS
- ISO/IEC 17025:2017
- DLA QTSL Services
- IPC Validation
- Certified ANSI/ESD S20.20-2014
STAFF CERTIFICATIONS
- J-STD-001 w/ Space Addendum
- IPC-A-600
- IPC-A-610
- IPC-6012
- IPC-7111/IPC-7721
Destructive Testing
TESTING PROCEDURE
- Cross-section Analysis
- Mechanical Decapsulation
- Chemical Decapsulation
- Wire Bond Pull
- Die Shear
- Dye Penetrant
- Resistance to Solvents
- Black Top Evaluation
- TGA Analysis
- Coupon Testing
- Die Cross-section
- Component removal from board
APPLICABLE METHODS
- Customized per Application
- Customized per Application
- MIL-STD-883, 750, AS6081/6171
- MIL-STD-883, 750, AS6081/6171
- Customized per Application
- Customized per Application
- IDEA 1010, AS6081/6171
- IDEA 1010, AS6081/6171
- ASTM E 334, ASTM E 1131
- Customized per Application
- Customized per Application
- Customized per Application